Research Facilities

Cs-corrected Scanning Transmission Electron Microscope
収差補正走査透過型電子顕微鏡

Instrument : Titan3 G2 60-300

FEI Company

設置場所 : 新世代棟1階

Specification

Accelerating voltage：60kV,80kV,200kV,300kV

Resolution：70pm(加速電圧300kV)

Resolution：70pm(加速電圧300kV)

Field Emission Gun

Attachment

double tilt holder

tomography holder

monochromatorー

Double spherical aberration corrector

Super-X　EDS system (4 separated SDDs)

GIF QuantumER

Primary use

Observation of high-resolution lattice images

1D/2D EDS mapping

Measurement of electronic state by EELS

3D image reconstruction using electron tomography

解析ソフトウェア等

Digital Micrograph (Gatan)

Inspect 3D (FEI)　3次元構造再構築

Amira (FEI)　3次元構造評価

Esprit 1.9 (Bruker)　EDS解析