Research Facilities
Scanning Electron Microscope(FE-SEM)
Scanning Electron Microscope
電界放射型走査型電子顕微鏡
Instrument : JSM-7001FA

Specification
Accelerating voltage:30kV
Primary use
Surface observation by secondary electrons and backscattered electrons
1D/2D EDS analysis
Crystallographic orientation analysis by EBSD system