Research Facilities

Scanning Electron Microscope(FE-SEM)

Scanning Electron Microscope
電界放射型走査型電子顕微鏡

Instrument : JSM-7001FA

Specification

Accelerating voltage:30kV

Primary use

Surface observation by secondary electrons and backscattered electrons

1D/2D EDS analysis

Crystallographic orientation analysis by EBSD system