Research Facilities

200kV Field-Emission Tranmisson Electron Microscope(FE-TEM）
電界放射型２００ｋＶ透過型電子顕微鏡

Instrument : JEM-2010F

Specification

Accelerating voltage：200kV

Illumination system：ZrO/W

Point-to-point resolution limit：0.19nm

Lattice resolution limit：0.10nm

最小プローブ径：0.5nm(EDSモード)、0.2nm (STEMモード)

Attachment

Double tilt analytical holder

二軸傾斜加熱ホルダー

Energy-dispersive X-ray spectrometer (EDS)(EDS)

Electron energy-loss spectrometer(EELS)

High-angle annular dark-field (HAADF) detector for STEM

Primary use

Observation of high-resolution lattice image

CBED and NBD analysis

1D/2D EDS mapping

Measurement of electronic state by EELS

Elemental mapping by energy filter (GIF)

Z-contrast imageing by STEM-HAADF