Research Facilities

200kV Transmission Electron Microscope(2000FX)
汎用200kV透過型電子顕微鏡

Instrument: JEM-2000FX

Specification

Accelerating voltage ：200kV

Point-to-point resolution limit：0.28nm

Lattice resolution limit：0.20nm

Attachment

Energy-dispersive X-ray spectrometer (EDS)

Camera

Primary use

Observation of bright-field and dark-field images

Observation of high-resolution lattice image

CBED・ナノビーム解析

Compositional analysis by EDS