Research Facilities
Equipment
Electron Microscope
| Instrument | Laser irradiation | Ion irradiation | Heating holder | Cooling holder | EDS | EELS | Tomography | Lorentz microscopy | EBSD | |
| TEM | JEM-ARM Multi-beam ultrahigh-voltage electron microscope |
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| H-1300 Pulsed-laser-equipped high-voltage electron microscope H-1300 *shutdown |
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| JEM 2000FX 200kV Multi-pupose JEM-2000FX |
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| TEM/ STEM |
JEM-2010F 200kV Field emission-type JEM-2010F |
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| Titan G2 Spherical aberration corrected Scanning Transmission Electron Microscope Titan G2 |
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| SEM | Scanning Electron Microscope JSM-7001FA |
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PERIPHERAL DEVICES AND TOOLS
Focused Ion Beam (FIB) devise （Micrion JFIB-2100）
Micro pickup device
Ion Milling System（Gatan DuoMill Model 600）
Precision ion polishing system（Gatan PIPS Model 691）
Extremely-Low-Energy ion beam workstation（Gentle Mill, TECHNOORG LINDA）
Automatic electrolytic thinning of specimens for TEM (Struers TenuPol 5)
RF Magnetron Sputter Coater (JEOL JEC-SP360)
Vacuum deposition equipment
Dimple Grinder
Surface grinder
Precision polishing machine
High-speed cutting machine
Precision cutting machine
Low-speed cutting machine
Hot plate
Disc cutting machine
Perforator
Vacuum deposition equipment
Arc melting furnace
Various electric furnaces
Rolling mill